Spectrographs

The manufacturer Andor Technology provides a range of spectral instruments suitable for a wide range of spectroscopy applications. Czerny-Turner with different focal lengths and echelle spectrographs come pre-aligned and pre-calibrated for ease of operation. The latest addition, the on-axis, high throughput, imaging Holospec spectrograph give superb results in milliseconds, not minutes.

The vacuum spectrographs from H + P Spectroscopy include models for VUV and XUV / EUV spectroscopy based on grazing light grids. The imaging properties without input slit maximizes signal strength. The spectrographs operate in selected wavelength ranges from 1 nm to 200 nm with a spectral resolution better than 0.03 nm.

The Shamrock and Kymera series from Andor offer a wide range of spectrographs to find a solution for every application. The main difference of the four models is the focal length: 193, 328, 500 and 750 mm, respectively. All models are based on the optical design according to Czerny-Turner.

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An extremely light sensitive transmission grating spectrograph with ultrafast F/1.8 aperture. The HoloSpec gathers more light than any Czerny-Turner and echelle spectrograph on the market. Therefore, it is the ideal solution for very faint spectroscopy applications. In addition, it has superior imaging properties.

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Robust, compact and manual 163 mm spectrograph in crossed Czerny-Turner setup. Combined with exchangeable grating and detector the system is a general purpose device for multiple applications in spectroscopy.

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Patented echelle optical design with a spectral band pass from 200 nm to 975 nm and a spectral resolution of λ/Δλ = 5000. The Andor Mechelle spectrograph displays the entire range in a single two-dimensional image and automatically captures the spectrum. The device works without any moving part.

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The vacuum spectrograph is designed upon chosen gratings with grazing incidence. The H+P models comprise an aberration-corrected flat field in one or more pre-defined wavelength ranges. By that the signal intensity is maximized. They achieve a spectral resolution of up to 0.03 nm in a range from 1 nm (soft X-ray) to 200 nm (VUV). The spectral ranges from 1 to 20 nm, from 5 to 80 nm and from 40 to 200 nm are covered by a single grating. The geometry of the spectrograph is given by the wavelength or energy range and the distance of the EUV/VUV light source. The modular layout allows adaptation to all kind of vacuum chambers and different samples herein. The systems are provided with a filter holder and a motorized grating mount with permanent monitoring.

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