Martin Klecka

Sales Manager


+420 607 014278


3D optical surface profiler with smart PSI and true color measurements
High-speed streaming cameras
3D metrology of aspheric surfaces
White light interferometer for roughness
Phase shifting Fizeau interferometer with vibration tolerant algorithm
EMCCD detectors for spectroscopy
Interferometer optimized for production metrology
Phase shifting Fizeau interferometer with ring light source
White light interferometer automated for production
Production Ready 3D Optical Profiler
Phase shifting Fizeau interferometer
Motorized Czerny-Turner spectrographs
sCMOS cameras
High-speed cameras with internal memory
Cameras and detectors for time-resolved imaging and spectroscopy
CCD cameras for direct detection (<20 keV)
In-situ spectroscopic ellipsometer iSE
Dynamic metrology
Wavelength shifting Fizeau interferometer for multi surface cavities
Widest spectral range ellipsometer VASE
Dichroic filters and sets
NIR spectroscopy with photo diode array
Ellipsometer for texture Si solar cells T-Solar
Low-noise CCD detectors
Vacuum spectrographs for VUV and XUV / EUV spectroscopy
Bi-concave lenses
Bi-convex lenses
Plano concave lenses
Plano convex lenses
Short introduction: Ellipsometry
Photo lithography systems
Spectroscopic ellipsometer for Vacuum Ultra Violet: VUV-VASE
FTIR ellipsometer IR-VASE
Dual rotating compensator ellipsometer RC2
Economic high precision table top ellipsometer Alpha-SE
Raman spectroscopy filters
Neutral density filter sets
Arc light sources
Fast spectroscopic ellipsometer M-2000
MSHD-300 with variable slits & MSHD-300F with fixed slits
Standard infrared bandpass filters
Standard bandpass filters and sets
Colored glass filters
MSH-300 with variable slits & MSH-300F with fixed slits
Monochromator order sorting filters
Heat control filters
Edge filters
Calibration filter sets
MSH-150 with variable slits & MSH-150F with fixed slits
Astronomy/UVBRI filters
Manual single grating spectrograph
High-performance CCD detectors
Echelle spectrograph
Cameras for indirect detection (>20 keV)
Stand-alone X-ray cameras



Jürgen Schlütter
Managing Director
+49 6151 8806-496
Fax: +49 6151 88069496
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European offices
© LOT Quantum Design 2016