Martin Klecka

Sales Manager


+420 607 014278


High-speed streaming cameras
High-throughput bright field and fluorescence scanner
Optical coherence tomography system
Cameras and detectors for time-resolved imaging and spectroscopy
Spectroscopic ellipsometer for Vacuum Ultra Violet: VUV-VASE
High-throughput bright-field scanner
Short introduction: Ellipsometry
FTIR ellipsometer IR-VASE
Ellipsometer for texture Si solar cells T-Solar
Fast spectroscopic ellipsometer M-2000
Motorized Czerny-Turner spectrographs
Widest spectral range ellipsometer VASE
Bi-concave lenses
Bi-convex lenses
Plano concave lenses
Plano convex lenses
Arc light sources
Dual rotating compensator ellipsometer RC2
In-situ spectroscopic ellipsometer iSE
Neutral density filter sets
Economic high precision table top ellipsometer Alpha-SE
Standard bandpass filters and sets
MSHD-300 with variable slits & MSHD-300F with fixed slits
Colored glass filters
Raman spectroscopy filters
Standard infrared bandpass filters
Edge filters
Dichroic filters and sets
Calibration filter sets
MSH-300 with variable slits & MSH-300F with fixed slits
Monochromator order sorting filters
Heat control filters
MSH-150 with variable slits & MSH-150F with fixed slits
Astronomy/UVBRI filters
EMCCD detectors for spectroscopy
sCMOS cameras
Manual single grating spectrograph
Vacuum spectrographs for VUV and XUV / EUV spectroscopy
High-throughput transmission grating spectrograph
High-performance CCD detectors
NIR spectroscopy with photo diode array
CCD cameras for direct detection (<20 keV)
Echelle spectrograph
Low-noise CCD detectors
Photo lithography systems
3D optical surface profiler with smart PSI and true color measurements
3D metrology of aspheric surfaces
White light interferometer for roughness
Phase shifting Fizeau interferometer with vibration tolerant algorithm
Dynamic metrology
Interferometer optimized for production metrology
Phase shifting Fizeau interferometer with ring light source
Wavelength shifting Fizeau interferometer for multi surface cavities
White light interferometer automated for production
White light interferometer for general purposes
Phase shifting Fizeau interferometer
Benchtop NMR MQC analyzer
Cameras for indirect detection (>20 keV)
High-speed cameras with internal memory
Stand-alone X-ray cameras



Jürgen Schlütter
Managing Director
+49 6151 8806-496
Fax: +49 6151 88069496
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© LOT Quantum Design 2016