Martin Klecka

Sales Manager


+420 607 014278


sCMOS cameras
Motorized Czerny-Turner spectrographs
Dichroic filters and sets
High-throughput transmission grating spectrograph
NIR spectroscopy with photo diode array
Ellipsometer for texture Si solar cells T-Solar
Low-noise CCD detectors
High-speed streaming cameras
Cameras and detectors for time-resolved imaging and spectroscopy
Vacuum spectrographs for VUV and XUV / EUV spectroscopy
CCD cameras for direct detection (<20 keV)
Bi-concave lenses
Bi-convex lenses
Plano concave lenses
Plano convex lenses
Short introduction: Ellipsometry
Photo lithography systems
Spectroscopic ellipsometer for Vacuum Ultra Violet: VUV-VASE
FTIR ellipsometer IR-VASE
Dual rotating compensator ellipsometer RC2
Economic high precision table top ellipsometer Alpha-SE
Widest spectral range ellipsometer VASE
Raman spectroscopy filters
Neutral density filter sets
Arc light sources
In-situ spectroscopic ellipsometer iSE
Fast spectroscopic ellipsometer M-2000
MSHD-300 with variable slits & MSHD-300F with fixed slits
Standard infrared bandpass filters
Standard bandpass filters and sets
Colored glass filters
MSH-300 with variable slits & MSH-300F with fixed slits
Monochromator order sorting filters
Heat control filters
Edge filters
Calibration filter sets
MSH-150 with variable slits & MSH-150F with fixed slits
Astronomy/UVBRI filters
EMCCD detectors for spectroscopy
Manual single grating spectrograph
High-performance CCD detectors
Echelle spectrograph
3D optical surface profiler with smart PSI and true color measurements
3D metrology of aspheric surfaces
White light interferometer for roughness
Phase shifting Fizeau interferometer with vibration tolerant algorithm
Dynamic metrology
Interferometer optimized for production metrology
Phase shifting Fizeau interferometer with ring light source
Wavelength shifting Fizeau interferometer for multi surface cavities
White light interferometer automated for production
White light interferometer for general purposes
Phase shifting Fizeau interferometer
Cameras for indirect detection (>20 keV)
High-speed cameras with internal memory
Stand-alone X-ray cameras



Jürgen Schlütter
Managing Director
+49 6151 8806-496
Fax: +49 6151 88069496
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© LOT Quantum Design 2016